Semiconductor Qualification Testing

The Reltech Independent Test laboratory is accredited to ISO17025:2005 and provides semiconductor companies with a fast, efficient and cost effective means of performing reliability and full turn-key qualification testing of their products at both device and package level. Using our advanced test systems we offer a full range of tests including High Temperature Operating Life (HTOL), Highly Accelerated Stress Test (HAST), Temperature Humidity Bias (THB), Preconditioning (PC), Temperature Cycling, ESD & Latch Up, ATE testing and Failure Analysis.

Our independent qualification test services are compliant with the requirements of a wide range of Industry Standards and Customer specific test specifications and processes, including:

  • JEDEC-JESD47I- “Stress Driven Qualification of Integrated Circuits”
  • MIL-STD 883C “Military Grade Component Screening”
  • Automotive Standard AEC-Q100 “Stress Qualification for Integrated Circuits”

The Reltech Independant Test Laboratory is a UKAS accredited Testing Laboratory, and testing is performed in accordance with the International Standard ISO/IEC 17025:2005 – “General Requirements for the competence of testing and calibration laboratories”

UKAS Colour Logo

Qualification tests provided include:

JEDEC Standard JESD47

Device Qualification Tests

  • High Temperature Operating Life (HTOL) JESD22-A108/JESD85
  • Early Life Failure Rate (ELFR) JESD22-A108/JESD74
  • Low Temperature Operating Life (LTOL) JESD22-A108
  • High Temperature Storage Life (HTSL) JESD22-A103
  • Latch-Up (LU) JESD78
  • Human Body Model ESD (ESD-HBM) JS-001
  • Charged Device Model ESD (ESD_CDM) JESD22-C101

 

Non-Hermetic Package Qualification Tests

  • MSL Preconditioning (prior to package tests)  (PC)  JESD22-A113
  • High Temperature Storage (HTS) JESD22-A103 & A113
  • Temperature Humidity Bias (THB) JESD22-A101
  • Biased Highly Accelerated Temperature & Humidity Stress (HAST) JESD22-A110
  • Unbiased HAST (UHAST) JESD22-A118
  • Temperature Cycling (TC) JESD22-A104