HTOL Systems & Hardware

Reltech designs and manufactures its own HTOL test systems, qualification boards, driver cards, and with multiple socket vendors. Our hardware capability is what makes us a reliability partner – not just a service provider.

– HTOL Systems

Proprietary Life Test Platforms

Reltech’s HTOL systems are engineered by our own team, validated on thousands of test programmes, and built to be flexible enough to serve a vast array of semiconductor technologies. 

Series 8000

HTOL System — Standard & Mid-Power

The Reltech 8000 Series is our principal HTOL platform – providing automated, multi-channel burn-in and life-testing under controlled temperature and programmable bias. Available in 25°C – 175°C configurations to support a wide range of device types from digital logic to linear ICs and power management devices.

Test Method

JEDEC JESD22-A108

Temp Range

+25°C to +175°C

Temperature Control

Individual DUT level

Channels

Up to 256 per system

Bias Voltage

Programmable per channel

Compliance

AEC Q-100 Grade 0–3

Monitoring

Real-time, device-level logging

Data Output

Automated report generation

Series 7000

HTOL / Burn-In Oven

The Reltech 7000 series system has evolved through the years.  It is based on a conventional oven style HTOL system with a lattice front structure allowing for flexible loading and unloading without interrupting HTOL qualification. 

 

Test Method

JESD22-A108 / A110

Temp Range

+25°C to +200°C

Capacity

Up to 512 devices

Temperature Control

Single chamber environment

Uniformity

±1.5°C across chamber

Compliance

AEC Q-100 / Q-101

Monitoring

Real-time data logging

Screening

Dynamic & static burn-in

– System Accessories

Qualification Boards, Driver Cards & Sockets

A test system is only as capable as its test interface. Reltech provides the complete hardware stack – from qualification boards to custom sockets – ensuring electrical integrity from system to device.

Qualification Boards

Custom PCB design for biased test methods. Engineered to maintain electrical integrity at elevated temperatures, with device-under-test connections optimised for best technical performance.

Driver Cards

Programmable driver cards for voltage and signal bias application across device channels. Supports multi-rail supply configurations and per-channel parametric monitoring throughout the stress programme.

Test Sockets

Precision-engineered interfaces that securely connect semiconductor devices to test equipment, enabling reliable electrical contact during testing without permanently attaching the device to bias hardware. 

Probe Cards

Wafer-level probe card solutions for die-level HTOL and parametric characterisation. Enables reliability data collection prior to packaging – critical for early characterisation on new process nodes.

Need a Bespoke Test Solution?

Our hardware team can design a custom system, qualification board or driver card for any package type or device configuration. Tell us what you’re testing and we’ll tell you what’s possible.

Request a Quotation

A member of the team will respond to your enquiry.