Semiconductor Qualification Testing

The Reltech Independent Test Laboratory is UKAS accredited to ISO17025:2017 and provides semiconductor companies with a fast, efficient and cost effective means of performing reliability and full turn-key qualification testing of their products at both device and package level. Using our advanced test systems we offer a full range of tests including High Temperature Operating Life (HTOL), Highly Accelerated Stress Test (HAST), Temperature Humidity Bias (THB), Preconditioning (PC), Temperature Cycling, ESD & Latch Up, ATE testing and Failure Analysis.

Please click here to see our UKAS Schedule of Accreditation  2806Testing Single (ukas.com)

Our independent qualification test services are compliant with the requirements of a wide range of Industry Standards and Customer specific test specifications and processes, including:

  • JEDEC-JESD47- “Stress Driven Qualification of Integrated Circuits”
  • MIL-STD 883C “Military Grade Component Screening”
  • Automotive Standard AEC-Q100 “Stress Qualification for Integrated Circuits”

The Reltech Independent Test Laboratory is a UKAS accredited Testing Laboratory, and testing is performed in accordance with the International Standard ISO/IEC 17025:2017 – “General Requirements for the competence of testing and calibration laboratories”

Qualification tests provided include:

JEDEC Standard JESD47

Device Qualification Tests

  • High Temperature Operating Life (HTOL) JESD22-A108/JESD85
  • Early Life Failure Rate (ELFR) JESD22-A108/JESD74
  • Low Temperature Operating Life (LTOL) JESD22-A108
  • High Temperature Storage Life (HTSL) JESD22-A103
  • Latch-Up (LU) JESD78
  • Human Body Model ESD (ESD-HBM) JS-001
  • Charged Device Model ESD (ESD_CDM) JESD22-C101

Non-Hermetic Package Qualification Tests

  • MSL Preconditioning (prior to package tests)  (PC)  JESD22-A113
  • High Temperature Storage (HTS) JESD22-A103 & A113
  • Temperature Humidity Bias (THB) JESD22-A101
  • Biased Highly Accelerated Temperature & Humidity Stress (HAST) JESD22-A110
  • Unbiased HAST (UHAST) JESD22-A118
  • Temperature Cycling (TC) JESD22-A104