Low Temperature Operating Life (LTOL) Test.

LTOL is being more used more and more frequently by manufacturers of low geometry devices as part of the qualification process, and in order to gain more failure data, a greater understanding of different failure modes of the device at low temperature, and to enable more complete reliability estimations. As device geometries decrease and frequencies become higher, Hot Carrier Injection (HCI) increases and the resulting degradation causes the deterioration of device characteristics and ultimately leads to failure.

LTOL is widely used in military, space and avionics applications where operation at sub-zero temperatures is required and reliability at such temperatures is a must. In a consumer market, the operation of life test at low temperatures is not such a strict requirement, however, for example a hand held mobile device manufacturer still requires to provide reliability data at low ambient conditions.

  • Reltech provides a full turn-key service for LTOL testing including LTOL board design and manufacture, test firmware programming and complete execution of the LTOL test according to JEDEC standard JESD22-A108, AECQ100 and other industry and customer specific standards
  • Typical lots size: 1 x 32 units
  • Junction temperature: < +50°C (typically 20°C to 30°C)
  • Typical chamber temperature: -40°C to -65°C
  • Duration: 1000 hours with intermediate read points
  • LTOL Driver cards are used to provide supply voltages, clock frequencies and input signals/test vectors
  • Bias conditions are determined to bias the maximum number of potential operating nodes in the device as in HTOL